Analysis of Particles & Contaminants
Scanning electron microscopy is an effective method to analyse the
fine particles from filters, contamination and debris. A scanning
electron microscope (SEM) uses an electron beam, rather than light,
to interact with atoms in the sample, producing information about the
surface morphology and composition of the sample.
The ability to
image and analyse individual particles can provide useful information
to identify the source of such particulate and hence determine any
necessary preventative measures. For example, a particular grade of
stainless steel present as machining swarf; globular welding spatter;
embedded wear debris; glass fragments with fine, identifying,
embossed details; mineral contamination at an adhesive joint, are
typical of the detailed information that can be elicited.
Our LEO 435VP is a high-performance, variable pressure scanning
electron microscope with a resolution of 4nm. Secondary and
back-scattered detectors allow for examination of surface topography
together with compositional information. Coupled with a thin-window
detector Oxford Isis 300 EDS system, it can be used for the
simultaneous analysis of elements from boron to uranium.
We offer a confidential and competitive service, expert support and
advice together with comprehensive reporting.